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📄 Abstract
Abstract: Operando microscopy provides direct insight into the dynamic chemical and
physical processes that govern functional materials, yet measurement noise
limits the effective resolution and undermines quantitative analysis. Here, we
present a general framework for integrating unsupervised deep learning-based
denoising into quantitative microscopy workflows across modalities and length
scales. Using simulated data, we demonstrate that deep denoising preserves
physical fidelity, introduces minimal bias, and reduces uncertainty in model
learning with partial differential equation (PDE)-constrained optimization.
Applied to experiments, denoising reveals nanoscale chemical and structural
heterogeneity in scanning transmission X-ray microscopy (STXM) of lithium iron
phosphate (LFP), enables automated particle segmentation and phase
classification in optical microscopy of graphite electrodes, and reduces
noise-induced variability by nearly 80% in neutron radiography to resolve
heterogeneous lithium transport. Collectively, these results establish deep
denoising as a powerful, modality-agnostic enhancement that advances
quantitative operando imaging and extends the reach of previously noise-limited
techniques.
Authors (7)
Samuel Degnan-Morgenstern
Alexander E. Cohen
Rajeev Gopal
Megan Gober
George J. Nelson
Peng Bai
+1 more
Submitted
October 31, 2025
Key Contributions
This paper presents a general framework for integrating unsupervised deep learning denoising into quantitative microscopy workflows. It demonstrates that deep denoising preserves physical fidelity, reduces uncertainty in model learning, and enables quantitative analysis of dynamic processes across various microscopy modalities.
Business Value
Enhances the precision and reliability of materials research by improving the quality of microscopy data, leading to faster discovery and development of advanced materials.